Ming-Dou KER


An Ultra-Low Voltage CMOS Voltage Controlled Oscillator with Process and Temperature Compensation
Ting-Chou LU Ming-Dou KER Hsiao-Wen ZAN 
Publication:   
Publication Date: 2017/08/01
Vol. E100-C  No. 8  pp. 675-683
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
ultra-low voltage (ULV)subthreshold regionvoltage-controlled oscillatortemperature and process variation
 Summary | Full Text:PDF(4MB)

A 8 Phases 192MHz Crystal-Less Clock Generator with PVT Calibration
Ting-Chou LU Ming-Dou KER Hsiao-Wen ZAN Jen-Chieh LIU Yu LEE 
Publication:   
Publication Date: 2017/01/01
Vol. E100-A  No. 1  pp. 275-282
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
crystal-less clock generatormulti-phase outputdigital power applicationprocessvoltage and temperature (PVT) calibration
 Summary | Full Text:PDF(2.8MB)

Impedance-Isolation Technique for ESD Protection Design in RF Integrated Circuits
Ming-Dou KER Yuan-Wen HSIAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/03/01
Vol. E92-C  No. 3  pp. 341-351
Type of Manuscript:  PAPER
Category: Electronic Components
Keyword: 
electrostatic discharge (ESD)impedance-isolation techniqueLC-tanknoise figure power gain
 Summary | Full Text:PDF(1.7MB)

Low-Capacitance and Fast Turn-on SCR for RF ESD Protection
Chun-Yu LIN Ming-Dou KER Guo-Xuan MENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1321-1330
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures (ICMTS2007))
Category: 
Keyword: 
electrostatic discharge (ESD)low capacitance (low-C)power amplifier (PA)radio-frequency (RF)silicon-controlled rectifier (SCR)waffle layout
 Summary | Full Text:PDF(2.1MB)

Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process
Jung-Sheng CHEN Ming-Dou KER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/03/01
Vol. E91-C  No. 3  pp. 378-384
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
gate-oxide reliabilitysample-and-hold amplifierdielectric breakdownbootstrapped switchswitched-capacitor circuit
 Summary | Full Text:PDF(1.1MB)

A CMOS Bandgap Reference Circuit for Sub-1-V Operation without Using Extra Low-Threshold-Voltage Device
Ming-Dou KER Jung-Sheng CHEN Ching-Yun CHU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/11/01
Vol. E88-C  No. 11  pp. 2150-2155
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
voltage referencebandgap voltage referencetemperature coefficientPSRR (power supply rejection ratio)startup circuit
 Summary | Full Text:PDF(920.2KB)

MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process
Ming-Dou KER Kun-Hsien LIN Che-Hao CHUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/03/01
Vol. E88-C  No. 3  pp. 429-436
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
electrostatic discharge (ESD)diodepoly-bounded diodeMOS-bounded diodeESD protection
 Summary | Full Text:PDF(1.3MB)