Michitarou YABUUCHI


Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model
Takuya KOMAWAKI Michitarou YABUUCHI Ryo KISHIDA Jun FURUTA Takashi MATSUMOTO Kazutoshi KOBAYASHI 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12  pp. 2758-2763
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
Random Telegraph NoisereliabilityVerilog-AMS
 Summary | Full Text:PDF(2.1MB)

Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs
Michitarou YABUUCHI Ryo KISHIDA Kazutoshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A  No. 12  pp. 2367-2372
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
BTIprocess variationreliability
 Summary | Full Text:PDF(1.2MB)