Michihiro SHINTANI


Identification and Application of Invariant Critical Paths under NBTI Degradation
Song BIAN Shumpei MORITA Michihiro SHINTANI Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12  pp. 2797-2806
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
NBTIaging effectinvariant critical pathprocessor
 Summary | Full Text:PDF(1.3MB)

Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation
Shumpei MORITA Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/07/01
Vol. E100-A  No. 7  pp. 1464-1472
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI mitigationreliabilitytransistor agingperformance degradationinternal node control
 Summary | Full Text:PDF(936.4KB)

Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability
Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7  pp. 1400-1409
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTIreliabilitystatic timing analysistiming characterizationaging-aware timing library
 Summary | Full Text:PDF(1017.4KB)

IDDQ Outlier Screening through Two-Phase Approach: Clustering-Based Filtering and Estimation-Based Current-Threshold Determination
Michihiro SHINTANI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/08/01
Vol. E97-D  No. 8  pp. 2095-2104
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
IDDQ testingk-means clusteringstatistical leakage current analysisBayes' theoremsimulated annealing
 Summary | Full Text:PDF(1.2MB)

Device-Parameter Estimation through IDDQ Signatures
Michihiro SHINTANI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/02/01
Vol. E96-D  No. 2  pp. 303-313
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
IDDQ testingstatistical leakage current analysisBayes' theorem
 Summary | Full Text:PDF(1.3MB)

A Variable-Length Coding Adjustable for Compressed Test Application
Hideyuki ICHIHARA Toshihiro OHARA Michihiro SHINTANI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/08/01
Vol. E90-D  No. 8  pp. 1235-1242
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
test compressionvariable-length codingtest application timeATEHuffman codeand test environment
 Summary | Full Text:PDF(309.9KB)

Huffman-Based Test Response Coding
Hideyuki ICHIHARA Michihiro SHINTANI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/01/01
Vol. E88-D  No. 1  pp. 158-161
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
Huffman codetest compressiontest responsetest application timeATE
 Summary | Full Text:PDF(103.9KB)