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Masayuki KIMISHIMA
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Introduction to Latest RF ATE with Low Test Cost Solutions
Masayuki KIMISHIMA
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Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2012/07/01
Vol. E95-C
No. 7
pp. 1147-1153
Type of Manuscript: Special Section PAPER (Special Section on Recent Trends of Microwave Systems and Their Fundamental Technologies)
Category: INVITED
Keyword:
ATE,
SoC tester,
SIP,
calibration,
LTCC,
MMIC,
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Summary |
Full Text:PDF
(4.8MB)
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Millimeter-Wave Broadband Mixers in New Testing and Measurement Instruments for High Data Rate Signal Analyses
Masayuki KIMISHIMA
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Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2005/10/01
Vol. E88-C
No. 10
pp. 1973-1980
Type of Manuscript: Special Section PAPER (Special Section on Recent Technologies on Devices, Circuits, and Systems for Millimeter-wave ITS Applications)
Category:
Keyword:
millimeter-wave,
spectrum analyzer,
mixer,
resistive mixer,
balun,
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Summary |
Full Text:PDF
(1.3MB)
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