Masato TAKEO


A Simulation Methodology for Bidirectional Hot-Carrier Degradation in a Static RAM Circuit
Norio KOIKE  Masato TAKEO  Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/20
Vol. E81-C  No. 6  pp. 959-967
Type of Manuscript: PAPER
Category: Integrated Electronics
Keyword: 
hot carrierbidirectional stressingcircuit reliabilitysimulation
  Summary |  Full Text:PDF (744.8KB)

Ferroelectric Memory Circuit Technology and the Application to Contactless IC Card
Koji ASARI  Hiroshige HIRANO  Toshiyuki HONDA  Tatsumi SUMI  Masato TAKEO  Nobuyuki MORIWAKI  George NAKANE  Tetsuji NAKAKUMA  Shigeo CHAYA  Toshio MUKUNOKI  Yuji JUDAI  Masamichi AZUMA  Yasuhiro SHIMADA  Tatsuo OTSUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/20
Vol. E81-C  No. 4  pp. 488-496
Type of Manuscript: Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
FeRAMhigh speedlow voltagelow power consumptionnon-volatilecontactless IC card
  Summary |  Full Text:PDF (1.2MB)

Hot-Carrier Aging Simulations of Voltage Controlled Oscillator
Norio KOIKE  Hirokazu NISHIMURA  Masato TAKEO  Tomoyuki MORII  Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/20
Vol. E79-C  No. 9  pp. 1285-1288
Type of Manuscript: LETTER
Category: Integrated Electronics
Keyword: 
hot carriercircuit reliabilitysimulationBERT
  Summary |  Full Text:PDF (345.2KB)