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Masao YANAGISAWA
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X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction Youhua SHI
Nozomu TOGAWA
Masao YANAGISAWA
Tatsuo OHTSUKI
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A
No. 12
pp. 3119-3127
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verfication Keyword: scan test,
test data compression,
X-masking,
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Summary |
Full Text:PDF
(850.7KB)
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A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss Youhua SHI
Nozomu TOGAWA
Masao YANAGISAWA
Tatsuo OHTSUKI
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A
No. 12
pp. 3514-3523
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification Keyword: scan test,
test data compression,
X-masking,
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Summary |
Full Text:PDF
(582.2KB)
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EDITORS' ADDRESS Suguru ARIMOTO
Masao YANAGISAWA
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/05/20
Vol. E82-A
No. 5
pp. 711-712
Type of Manuscript: EDITORS' ADDRESS
Category: Keyword:
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Summary |
Full Text:PDF
(172.5KB)
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A Depth-Constrained Technology Mapping Algorithm for Logic-Blocks Composed of Tree-Structured LUTs Nozomu TOGAWA
Koji ARA
Masao YANAGISAWA
Tatsuo OHTSUKI
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/03/20
Vol. E82-A
No. 3
pp. 473-482
Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 11th Workshop on Circuits and Systems in Karuizawa)
Category: Keyword: technology mapping,
logic-block,
lookup table,
logic depth,
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(451.2KB)
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