Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C
No. 5
pp. 720-725
Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword:
high-frequency,
SiGe,
heterojunction bipolar transistor,
pulsed measurement,
self-heating effect,
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