Li TIAN

A Two-Stage Point Pattern Matching Algorithm Using Ellipse Fitting and Dual Hilbert Scans
Li TIAN  Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/10/01
Vol. E91-D  No. 10  pp. 2477-2484
Type of Manuscript: PAPER
Category: Pattern Recognition
Keyword: 
point pattern matching,  ellipse fitting,  Hilbert scan,  transformation parameter estimation,  search space reduction, 
  Summary |  Full Text:PDF (412.4KB)
Image Enhancement by Analysis on Embedded Surfaces of Images and a New Framework for Enhancement Evaluation
Li TIAN  Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/07/01
Vol. E91-D  No. 7  pp. 1946-1954
Type of Manuscript: Special Section PAPER (Special Section on Machine Vision and its Applications)
Category: 
Keyword: 
image enhancement,  low contrast and low illumination,  human vision system,  image embedding,  enhancement evaluation, 
  Summary |  Full Text:PDF (4.7MB)
A New Framework for Constructing Accurate Affine Invariant Regions
Li TIAN  Sei-ichiro KAMATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/11/01
Vol. E90-D  No. 11  pp. 1831-1840
Type of Manuscript: PAPER
Category: Image Recognition, Computer Vision
Keyword: 
affine invariant region,  Path Growing,  Thresholding Seeded Growing Regions,  ellipse fitting,  near-duplicate detection, 
  Summary |  Full Text:PDF (1.8MB)
A Fast and Accurate Algorithm for Matching Images Using Hilbert Scanning Distance with Threshold Elimination Function
Li TIAN  Sei-ichiro KAMATA  Kazuyuki TSUNEYOSHI  Haijiang TANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/01/01
Vol. E89-D  No. 1  pp. 290-297
Type of Manuscript: PAPER
Category: Pattern Recognition
Keyword: 
point pattern matching,  Hausdorff distance,  Hilbert curve,  Hilbert scanning distance,  threshold elimination function, 
  Summary |  Full Text:PDF (1.1MB)