Kun-Ming CHEN

Noise Parameters Computation of Microwave Devices Using Genetic Algorithms
Han-Yu CHEN  Guo-Wei HUANG  Kun-Ming CHEN  Chun-Yen CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/07/01
Vol. E88-C  No. 7  pp. 1382-1384
Type of Manuscript: Special Section LETTER (Special Section on Recent Technologies of Microwave and Millimeter-Wave Devices Focusing on Miniaturization and Advancement in Performance with Their Applications)
Category: Active Circuits & Antenna
Keyword: 
noisy two-port,  noise parameters,  genetic algorithm, 
  Summary |  Full Text:PDF (248.9KB)
A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit
Han-Yu CHEN  Kun-Ming CHEN  Guo-Wei HUANG  Chun-Yen CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/06/01
Vol. E88-C  No. 6  pp. 1133-1141
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: Model
Keyword: 
HBT's,  small signal modeling,  T-topology,  hybrid-π equivalent circuit, 
  Summary |  Full Text:PDF (1.1MB)
A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement
Ming-Hsiang CHO  Guo-Wei HUANG  Chia-Sung CHIU  Kun-Ming CHEN  An-Sam PENG  Yu-Min TENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 845-850
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
automatic measurement,  cascade configuration,  on-wafer de-embedding,  silicon,  S-parameters, 
  Summary |  Full Text:PDF (999.1KB)
RF MOSFET Characterization by Four-Port Measurement
Shih-Dao WU  Guo-Wei HUANG  Kun-Ming CHEN  Hua-Chou TSENG  Tsun-Lai HSU  Chun-Yen CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 851-856
Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
4-port,  RF MOSFET,  common source,  common gate,  common drain,  substrate bias, 
  Summary |  Full Text:PDF (904.2KB)
A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement
Han-Yu CHEN  Kun-Ming CHEN  Guo-Wei HUANG  Chun-Yen CHANG  Tiao-Yuan HUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 726-732
Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
threshold voltage,  effective channel length,  channel mobility,  S-parameter,  automatic measurement, 
  Summary |  Full Text:PDF (532.1KB)
An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement
Sheng-Yu WEN  Guo-Wei HUANG  Kun-Ming CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 742-748
Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
on-wafer,  noise figure measurement,  low-noise amplifier, 
  Summary |  Full Text:PDF (1.1MB)
High-Frequency Characteristics of SiGe Heterojunction Bipolar Transistors under Pulsed-Mode Operation
Kun-Ming CHEN  Guo-Wei HUANG  Li-Hsin CHANG  Hua-Chou TSENG  Tsun-Lai HSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 720-725
Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
high-frequency,  SiGe,  heterojunction bipolar transistor,  pulsed measurement,  self-heating effect, 
  Summary |  Full Text:PDF (1.2MB)