Koichiro NATSUME

Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs
Kazumi HATAYAMA  Michinobu NAKAO  Yoshikazu KIYOSHIGE  Koichiro NATSUME  Yasuo SATO  Takaharu NAGUMO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12  pp. 3318-3323
Type of Manuscript: Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
BIST,  test pattern generator,  neighborhood pattern,  LFSR,  reseeding, 
  Summary |  Full Text:PDF (429.2KB)
Deterministic Built-in Test with Neighborhood Pattern Generator
Michinobu NAKAO  Yoshikazu KIYOSHIGE  Koichiro NATSUME  Kazumi HATAYAMA  Satoshi FUKUMOTO  Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/05/01
Vol. E85-D  No. 5  pp. 874-883
Type of Manuscript: PAPER
Category: Fault Tolerance
Keyword: 
BIST,  test pattern generator,  reseeding,  bit-flipping,  seed generation, 
  Summary |  Full Text:PDF (843.7KB)