Kiyotaka KOMOKU


Modeling and Layout Optimization of MOM Capacitor for High-Frequency Applications
Yuka ITANO Taishi KITANO Yuta SAKAMOTO Kiyotaka KOMOKU Takayuki MORISHITA Nobuyuki ITOH 
Publication:   
Publication Date: 2018/02/01
Vol. E101-A  No. 2  pp. 441-446
Type of Manuscript:  Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
MOM capacitorparasitic resistanceparasitic inductancelayout optimization
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A Study of Striped Inductor for K- and Ka-Band Voltage-Controlled Oscillators
Nobuyuki ITOH Hiroki TSUJI Yuka ITANO Takayuki MORISHITA Kiyotaka KOMOKU Sadayuki YOSHITOMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/06/01
Vol. E99-C  No. 6  pp. 614-622
Type of Manuscript:  INVITED PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
skin effectstriped inductorQ factorcorner frequencyvoltage-controlled oscillatorphase noise
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Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide
Toshihiro MATSUDA Shinsuke ISHIMARU Shingo NOHARA Hideyuki IWATA Kiyotaka KOMOKU Takayuki MORISHITA Takashi OHZONE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/12/01
Vol. E92-C  No. 12  pp. 1523-1530
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOS capacitorsSi-implantationthermal oxideI-V hysteresishysteresis windownonvolatile memory
 Summary | Full Text:PDF(1.7MB)

A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs
Toshihiro MATSUDA Yuya SUGIYAMA Keita NOHARA Kazuhiro MORITA Hideyuki IWATA Takashi OHZONE Takayuki MORISHITA Kiyotaka KOMOKU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1331-1337
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures (ICMTS2007))
Category: 
Keyword: 
CMOSsymmetryorientation dependencedrain currentsubstrate current
 Summary | Full Text:PDF(1.1MB)

A CMOS Temperature Sensor Circuit
Takashi OHZONE Tatsuaki SADAMOTO Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4  pp. 895-902
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
CMOStemperature sensortemperature dependent voltagesubthreshold current
 Summary | Full Text:PDF(869.8KB)

A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width
Takashi OHZONE Eiji ISHII Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/02/01
Vol. E90-C  No. 2  pp. 515-522
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
CMOSFETreliabilityLDD-typechannel widthisolation
 Summary | Full Text:PDF(1.3MB)

A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET
Takashi OHZONE Kazuhiko OKADA Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/09/01
Vol. E89-C  No. 9  pp. 1351-1357
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
CMOSFETLDD-typesource/drain-resistancesheet resistance
 Summary | Full Text:PDF(997KB)