Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/02/01 Vol. E88-CNo. 2pp. 255-263 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: DRAM,
redundancy,
high speed,
high density,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/04/20 Vol. E80-CNo. 4pp. 582-589 Type of Manuscript: Special Section PAPER (Special Issue on Circuit Technologies for Memory and Analog LSIs) Category: Keyword: DRAM,
test,
redundancy,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/07/20 Vol. E79-CNo. 7pp. 986-996 Type of Manuscript: Special Section PAPER (Special Issue on the 1995 Symposium on VLSI Circuits (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.31, No.4 April 1996)) Category: Memory Keyword:
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/06/20 Vol. E78-CNo. 6pp. 719-727 Type of Manuscript: Special Section PAPER (Special Issue on the 1994 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol. 30, No. 4 April 1995)) Category: Keyword:
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/05/20 Vol. E77-CNo. 5pp. 864-868 Type of Manuscript: Special Section LETTER (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994)) Category: Keyword:
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1991/11/20 Vol. E74-CNo. 11pp. 3796-3802 Type of Manuscript: Special Section PAPER (Special Issue on the High Performance ASIC and Microprocessor) Category: System VLSI Keyword: