Katsuya FUJIWARA


Realization of SR-Equivalents Using Generalized Shift Registers for Secure Scan Design
Hideo FUJIWARA Katsuya FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/08/01
Vol. E99-D  No. 8  pp. 2182-2185
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design-for-testabilityscan designgeneralized feedback/feed-forward shift registerssecurityscan-based side-channel attack
 Summary | Full Text:PDF(399.6KB)

Properties of Generalized Feedback Shift Registers for Secure Scan Design
Hideo FUJIWARA Katsuya FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/04/01
Vol. E99-D  No. 4  pp. 1255-1258
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design-for-testabilityscan designgeneralized feedback/feed-forward shift registerssecurityscan-based side-channel attack
 Summary | Full Text:PDF(395.2KB)

Strongly Secure Scan Design Using Generalized Feed Forward Shift Registers
Hideo FUJIWARA Katsuya FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2015/10/01
Vol. E98-D  No. 10  pp. 1852-1855
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design-for-testabilityscan designgeneralized feed-forward shift registerssecurityscan-based side-channel attack
 Summary | Full Text:PDF(352.9KB)

Generalized Feed Forward Shift Registers and Their Application to Secure Scan Design
Katsuya FUJIWARA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/05/01
Vol. E96-D  No. 5  pp. 1125-1133
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
design-for-testabilityscan designshift register equivalentsshift register quasi-equivalentsgeneralized feed-forward shift registerssecurityscan-based side-channel attack
 Summary | Full Text:PDF(1.7MB)

Differential Behavior Equivalent Classes of Shift Register Equivalents for Secure and Testable Scan Design
Katsuya FUJIWARA Hideo FUJIWARA Hideo TAMAMOTO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/07/01
Vol. E94-D  No. 7  pp. 1430-1439
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
design-for-testabilityscan designshift register equivalentssecurityscan-based side-channel attack
 Summary | Full Text:PDF(599.1KB)