Katsunori MAKIHARA


Photoexcited Carrier Transfer in a NiSi-Nanodots/Si-Quantum-Dots Hybrid Floating Gate in MOS Structures
Mitsuhisa IKEDA  Katsunori MAKIHARA  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 694-698
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
silicon quantum dotsilicide nanodothybrid floating gateoptical response
  Summary |  Full Text:PDF (1.1MB)

X-Ray Photoemission Study of SiO2/Si/Si0.55Ge0.45/Si Heterostructures
Akio OHTA  Katsunori MAKIHARA  Seiichi MIYAZAKI  Masao SAKURABA  Junichi MUROTA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 680-685
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
silicon germaniumheterostructurechemical bonding featuresvalence band alignmentX-ray photoelectron spectroscopy
  Summary |  Full Text:PDF (2.5MB)

Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System
Motoki FUKUSIMA  Akio OHTA  Katsunori MAKIHARA  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 708-713
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
resistive random access memory (ReRAM)Si oxidechemical bonding featuresX-ray photoelectron spectroscopyresistance switching property
  Summary |  Full Text:PDF (676.9KB)

Evaluation of Chemical Composition and Bonding Features of Pt/SiOx/Pt MIM Diodes and Its Impact on Resistance Switching Behavior
Akio OHTA  Katsunori MAKIHARA  Mitsuhisa IKEDA  Hideki MURAKAMI  Seiichiro HIGASHI  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 702-707
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Resistive Random Access Memory (ReRAM)Si oxidePt electrodeschemical bonding featuresresistance switching
  Summary |  Full Text:PDF (1.3MB)

Characterization of Local Electronic Transport through Ultrathin Au/Highly-Dense Si Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy
Daichi TAKEUCHI  Katsunori MAKIHARA  Mitsuhisa IKEDA  Seiichi MIYAZAKI  Hirokazu KAKI  Tsukasa HAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5  pp. 718-721
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Si nanocolumnar structureAFMcurrent imageelectron emission
  Summary |  Full Text:PDF (1.9MB)

Study on Collective Electron Motion in Si-Nano Dot Floating Gate MOS Capacitor
Masakazu MURAGUCHI  Yoko SAKURAI  Yukihiro TAKADA  Shintaro NOMURA  Kenji SHIRAISHI  Mitsuhisa IKEDA  Katsunori MAKIHARA  Seiichi MIYAZAKI  Yasuteru SHIGETA  Tetsuo ENDOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5  pp. 730-736
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
electron dynamicscollective motion of electronSi-nano dottwo-dimensional electron gastunnelingSi-nano dot type floating gate MOS capacitor
  Summary |  Full Text:PDF (1.3MB)

Impact of Annealing Ambience on Resistive Switching in Pt/TiO2/Pt Structure
Guobin WEI  Yuta GOTO  Akio OHTA  Katsunori MAKIHARA  Hideki MURAKAMI  Seiichiro HIGASHI  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5  pp. 699-704
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
ReRAMTiO2low temperatureH2 annealingcharge trapping
  Summary |  Full Text:PDF (691.1KB)

Random Telegraph Signals in Two-Dimensional Array of Si Quantum Dots
Katsunori MAKIHARA  Mitsuhisa IKEDA  Akira KAWANAMI  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 569-572
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Emerging Devices
Keyword: 
Si quantum dotsrandom telegraph signalsAFM/KFM
  Summary |  Full Text:PDF (2.5MB)

Formation of Pd Nanodots Induced by Remote Hydrogen Plasma and Its Application to Floating Gate MOS Memories
Kazuhiro SHIMANOE  Katsunori MAKIHARA  Mitsuhisa IKEDA  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5  pp. 616-619
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Pd nanodotremote hydrogen plasmafloating gate MOS memory
  Summary |  Full Text:PDF (520.5KB)

Progress on Charge Distribution in Multiply-Stacked Si Quantum Dots/SiO2 Structure as Evaluated by AFM/KFM
Katsunori MAKIHARA  Mitsuhisa IKEDA  Seiichiro HIGASHI  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 712-715
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Si quantum dotsAFM/KFM
  Summary |  Full Text:PDF (648.8KB)

Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique
Katsunori MAKIHARA  Yoshihiro OKAMOTO  Hideki MURAKAMI  Seiichiro HIGASHI  Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4  pp. 705-708
Type of Manuscript: Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Nanomaterials and Quantum-Effect Devices
Keyword: 
nanocrystalAFMconducting probelocal characterization
  Summary |  Full Text:PDF (439.9KB)