Katsuhiro AOKI


Formation of Reliable Pb(Ti, Zr)O3 Thin-Film Capacitors for Read/Write Endurance of Ferroelectric Non-volatile Memories
Katsuhiro AOKI Yukio FUKUDA Ken NUMATA Akitoshi NISHIMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4  pp. 537-544
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
PZTfatigueferroelectricthin-film capacitoriridiumsol-gel
 Summary | Full Text:PDF(780.2KB)

Influence of the Relaxation Current in BaxSr(1-x) TiO3 Thin Film Capacitors on DRAM Operation
Ken NUMATA Yukio FUKUDA Katsuhiro AOKI Yasutoshi OKUNO Akitoshi NISHIMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/25
Vol. E80-C  No. 7  pp. 1043-1055
Type of Manuscript:  PAPER
Category: Recording and Memory Technologies
Keyword: 
cell capacitor dielectricrelaxation currentBSTpower lawdivergence
 Summary | Full Text:PDF(877KB)