Jung-Sheng CHEN


Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process
Jung-Sheng CHEN Ming-Dou KER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/03/01
Vol. E91-C  No. 3  pp. 378-384
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
gate-oxide reliabilitysample-and-hold amplifierdielectric breakdownbootstrapped switchswitched-capacitor circuit
 Summary | Full Text:PDF(1.1MB)

A CMOS Bandgap Reference Circuit for Sub-1-V Operation without Using Extra Low-Threshold-Voltage Device
Ming-Dou KER Jung-Sheng CHEN Ching-Yun CHU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/11/01
Vol. E88-C  No. 11  pp. 2150-2155
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
voltage referencebandgap voltage referencetemperature coefficientPSRR (power supply rejection ratio)startup circuit
 Summary | Full Text:PDF(920.2KB)