Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C
No. 4
pp. 487-494
Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category:
Keyword:
process variability,
all digital,
on-chip monitor,
buffer ring,
NBTI,
PBTI,
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