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Ho-Yong CHOI
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Synthesis for Testability of Synchronous Sequential Circuits with Strong-Connectivity Using Undefined States on State Transition Graph Soo-Hyun KIM
Ho-Yong CHOI
Kiseon KIM
Dong-Ik LEE
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A
No. 12
pp. 3216-3223
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test Keyword: synthesis for testability,
undefined states,
redundant faults,
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(230.8KB)
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High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph Eunjung OH
Soo-Hyun KIM
Dong-Ik LEE
Ho-Yong CHOI
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/12/01
Vol. E85-A
No. 12
pp. 2674-2683
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test Generation Keyword: asynchronous circuits,
ATPG,
STG,
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(834.7KB)
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Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification Eunjung OH
Jeong-Gun LEE
Dong-Ik LEE
Ho-Yong CHOI
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A
No. 6
pp. 1506-1514
Type of Manuscript: Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000))
Category: Keyword: ATPG,
SI asynchronous circuits,
signal transition graph,
testing,
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(779.6KB)
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