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Hiroyuki OCHI
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Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures Takashi IMAGAWA
Masayuki HIROMOTO
Hiroyuki OCHI
Takashi SATO
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Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A
No. 12
pp. 2524-2532
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design Keyword: soft error,
TMR,
reliability,
methodology,
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Summary |
Full Text:PDF
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