Hiromitsu AWANO

Identification and Application of Invariant Critical Paths under NBTI Degradation
Song BIAN Shumpei MORITA Michihiro SHINTANI Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12  pp. 2797-2806
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
NBTI, aging effect, invariant critical path, processor, 
 Summary | Full Text:PDF(1.3MB)
Efficient Aging-Aware Failure Probability Estimation Using Augmented Reliability and Subset Simulation
Hiromitsu AWANO Takashi SATO 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12  pp. 2807-2815
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
failure probability calculation, NBTI, Monte Carlo, subset simulation, augmented reliability, 
 Summary | Full Text:PDF(672.3KB)
Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling
Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7  pp. 1390-1399
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
SRAM cell yield, failure probability calculation, NBTI, importance sampling, particle filter, Monte Carlo method, 
 Summary | Full Text:PDF(1.7MB)
Automation of Model Parameter Estimation for Random Telegraph Noise
Hirofumi SHIMIZU Hiromitsu AWANO Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A  No. 12  pp. 2383-2392
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
random telegraph noise (RTN), Gaussian mixture model (GMM), expectation-maximization (EM) algorithm, information criteria, model estimation, 
 Summary | Full Text:PDF(1.5MB)
Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method
Hiromitsu AWANO Hiroshi TSUTSUI Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A  No. 12  pp. 2272-2283
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
random telegraph noise, Bayesian estimation, Markov chain Monte Carlo, device characterization, source separation, statistical machine learning, 
 Summary | Full Text:PDF(3.3MB)