Hirohisa TANAKA

Efficient Dynamic Fault Imaging by Fully Utilizing CAD Data in CAD-Linked Electron Beam Test System
Koji NAKAMAE Hirohisa TANAKA Hideharu KUBOTA Hiromu FUJITA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 546-551
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
vacuum and beam technologieselectron beam testingdynamic fault imagingCAD dataimage processing
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