IEICE SEARCH SYSTEM

Hidenari NAKASHIMA

Impact of Self-Heating in Wire Interconnection on Timing Toshiki KANAMOTO Takaaki OKUMURA Katsuhiro FURUKAWA Hiroshi TAKAFUJI Atsushi KUROKAWA Koutaro HACHIYA Tsuyoshi SAKATA Masakazu TANAKA Hidenari NAKASHIMA Hiroo MASUDA Takashi SATO Masanori HASHIMOTO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2010/03/01 Vol. E93-C No. 3 pp. 388-392 Type of Manuscript: BRIEF PAPER Category: Keyword: interconnect, delay variation, parasitic resistance, thermal, temperature, self-heat, SoC,
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An Approach for Reducing Leakage Current Variation due to Manufacturing Variability Tsuyoshi SAKATA Takaaki OKUMURA Atsushi KUROKAWA Hidenari NAKASHIMA Hiroo MASUDA Takashi SATO Masanori HASHIMOTO Koutaro HACHIYA Katsuhiro FURUKAWA Masakazu TANAKA Hiroshi TAKAFUJI Toshiki KANAMOTO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/12/01 Vol. E92-A No. 12 pp. 3016-3023 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Device and Circuit Modeling and Analysis Keyword: low power, leakage, gate delay model, variation,
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Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations Takaaki OKUMURA Atsushi KUROKAWA Hiroo MASUDA Toshiki KANAMOTO Masanori HASHIMOTO Hiroshi TAKAFUJI Hidenari NAKASHIMA Nobuto ONO Tsuyoshi SAKATA Takashi SATO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/04/01 Vol. E92-A No. 4 pp. 990-997 Type of Manuscript: Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa) Category: Keyword: SSTA, output, transition time, gate delay model, process variation,
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Proposal of Metrics for SSTA Accuracy Evaluation Hiroyuki KOBAYASHI Nobuto ONO Takashi SATO Jiro IWAI Hidenari NAKASHIMA Takaaki OKUMURA Masanori HASHIMOTO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2007/04/01 Vol. E90-A No. 4 pp. 808-814 Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa) Category: Keyword: statistical static timing analysis, statistical max operation, DFM, SoC,
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Fast Methods to Estimate Clock Jitter due to Power Supply Noise Koutaro HACHIYA Takayuki OHSHIMA Hidenari NAKASHIMA Masaaki SODA Satoshi GOTO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2007/04/01 Vol. E90-A No. 4 pp. 741-747 Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa) Category: Keyword: clock jitter, power supply noise, clock distribution network, power distribution network,
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Circuit Performance Prediction Considering Core Utilization with Interconnect Length Distribution Model Hidenari NAKASHIMA Junpei INOUE Kenichi OKADA Kazuya MASU
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/12/01 Vol. E88-A No. 12 pp. 3358-3366 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Prediction and Analysis Keyword: interconnect, layout compaction, physical design, placement, core utilization,
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Wire Length Distribution Model for System LSI Takanori KYOGOKU Junpei INOUE Hidenari NAKASHIMA Takumi UEZONO Kenichi OKADA Kazuya MASU
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/12/01 Vol. E88-A No. 12 pp. 3445-3452 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Interconnect Keyword: wire length distribution, core utilization, SoC, layout-area allocation,
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Evaluation of X Architecture Using Interconnect Length Distribution Hidenari NAKASHIMA Naohiro TAKAGI Junpei INOUE Kenichi OKADA Kazuya MASU
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/12/01 Vol. E88-A No. 12 pp. 3437-3444 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Interconnect Keyword: X architecture, interconnect length distribution, ILD, Rent's rule, all-directional interconnect,
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