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Hideaki KAMEYAMA
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Pronounced Paradigm Shift-- Terrestrial Neutron-Induced Error of Semiconductor Devices--
Eishi IBE
Yasuo YAHAGI
Hideaki KAMEYAMA
Hironaru YAMAGUCHI
Mitsumori HIDAKA
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Publication: C - Abstracts of IEICE TRANSACTIONS on Electronics (Japanese Edition)
Publication Date: 2006/07/01
Vol. J89-C
No. 7
pp. 440-449
Type of Manuscript: PAPER
Category:
Keyword:
terrestrial neutron,
spallation,
single event,
soft-error,
firm error,
latchup,
cluster,
interleave,
SEFI,
SET,
microlatch,
quasi-mono energy neutron test,
white neutron test,
international standard,
JEITA,
JEDEC,
JESD89,
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Summary |
Full Text(in Japanese):PDF
(1.9MB)
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