Hao ZHU


A Novel Pattern Run-Length Coding Method for Test Data Compression
Diancheng WU Yu LIU Hao ZHU Donghui WANG Chengpeng HAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/09/01
Vol. E96-C  No. 9  pp. 1201-1204
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
Automatic Test Equipmenttest data compressionpattern run-length codingX-assigning
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