Guiming LUO


Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing
Zhou JIANG Guiming LUO Kele SHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/09/01
Vol. E99-C  No. 9  pp. 1071-1079
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
scan testscan segmentationlower power testingcomplex networks clusteringdesign for testabilityat-speed testing
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