Go MATSUKAWA


Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path
Go MATSUKAWA Yuta KIMI Shuhei YOSHIDA Shintaro IZUMI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/06/01
Vol. E99-A  No. 6  pp. 1198-1205
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
single event effectsingle event upsetsoft error propagationlogical maskingtemporal masking
 Summary | Full Text:PDF(1.7MB)

A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme
Go MATSUKAWA Yohei NAKATA Yasuo SUGURE Shigeru OHO Yuta KIMI Masafumi SHIMOZAWA Shuhei YOSHIDA Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/04/01
Vol. E98-C  No. 4  pp. 333-339
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design---Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
dual modular redundancycheckpoint recoveryfault-tolerance
 Summary | Full Text:PDF(3.5MB)