Feng LIANG


Compact Analytical Threshold Voltage Model of Strained Gate-All-Around MOSFET Fabricated on Si1-xGex Virtual Substrate
Yefei ZHANG Zunchao LI Chuang WANG Feng LIANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/02/01
Vol. E99-C  No. 2  pp. 302-307
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
compact modelingthreshold voltagestrained silicongate-all-around MOSFETSi1-xGex virtual substrate
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An Optimized Auto-tuning Digital DC--DC Converter Based on Linear-Non-Linear and Predictive PID
Chuang WANG Zunchao LI Cheng LUO Lijuan ZHAO Yefei ZHANG Feng LIANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/08/01
Vol. E97-C  No. 8  pp. 813-819
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
Auto-tuning ControlDigital DC--DCStabilityPredictive ControlPower Management
 Summary | Full Text:PDF(1.6MB)

Fractionally Spaced Equalization for Asynchronous Broadband Analog Network Coding
Zhaoxi FANG Feng LIANG Shaozhong ZHANG Xiaolin ZHOU 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2012/11/01
Vol. E95-B  No. 11  pp. 3617-3620
Type of Manuscript:  LETTER
Category: Wireless Communication Technologies
Keyword: 
analog network codingasynchronousbi-directional transmissionfractionally spaced equalizer
 Summary | Full Text:PDF(260.4KB)

Analytical Drain Current Modeling of Dual-Material Surrounding-Gate MOSFETs
Zunchao LI Jinpeng XU Linlin LIU Feng LIANG Kuizhi MEI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6  pp. 1120-1126
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsurrounding-gatedual-materialhalo
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A Low Power Test Pattern Generator for BIST
Shaochong LEI Feng LIANG Zeye LIU Xiaoying WANG Zhen WANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 696-702
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
built-in self-test (BIST)powersingle input change (SIC)fault coverage
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Analytical and Numerical Study of the Impact of Halos on Surrounding-Gate MOSFETs
Zunchao LI Ruizhi ZHANG Feng LIANG Zhiyong YANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4  pp. 558-563
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETsurrounding-gatecompact modelhalo
 Summary | Full Text:PDF(416.3KB)

A Single Input Change Test Pattern Generator for Sequential Circuits
Feng LIANG ShaoChong LEI ZhiBiao SHAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1365-1370
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
built-in self-test (BIST)single input change (SIC) sequenceseedsequential circuit
 Summary | Full Text:PDF(341.7KB)