Dong Uk LEE


Electrical Characterization of Nano-Floating Gated Silicon-on-Insulator Memory with In2O3 Nano-Particles Embedded in Polyimide Insulator
Dong Uk LEE  Seon Pil KIM  Tae Hee LEE  Eun Kyu KIM  Hyun-Mo KOO  Won-Ju CHO  Young-Ho KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 747-750
Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
In2O3memorySOInano-particlesnonvolatile
  Summary |  Full Text:PDF (713.2KB)