Publication: D - Abstracts of IEICE TRANSACTIONS on Information and Systems (Japanese Edition)
Publication Date: 2006/08/01
Vol. J89-D
No. 8
pp. 1717-1728
Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing)
Category:
Keyword:
delay test,
fault model,
transition delay fault,
test quality,
|
